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Preparation of cross-section specimens for AFM imaging of metal/semiconductor interfaces

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Journal of Materials Science Letters

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Authors and Affiliations

  1. Department of Mining, Metallurgical and Petroleum Engineering, University of Alberta, T6G 2G6, Edmonton, Alberta, Canada

    J. Yoon & D. G. Ivey

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  1. J. Yoon
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  2. D. G. Ivey
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Yoon, J., Ivey, D.G. Preparation of cross-section specimens for AFM imaging of metal/semiconductor interfaces. J Mater Sci Lett 15, 551–554 (1996). https://doi.org/10.1007/BF00579247

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  • DOI: https://doi.org/10.1007/BF00579247

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