Abstract
The design of a stage to bend materials in a scanning electron-microscope (Stereoscan, Cambridge Scientific Instruments Ltd) is described together with examples of its use in the fracture of composite materials. The bend module, when fitted to a large modular stage, can be used with existing scanning electron microscopes and is capable of bending, under increasing load or cyclic loading conditions, rectangular specimens of a maximum size 44×4×1.5 mm, to a maximum strain of 1.5%. Using the module with a standard display system the non-catastrophic stages of deformation and failure can be followed at higher magnification than has previously been possible. When the module is used in conjunction with a fast scanning and display system, deformation and fracture processes may be recorded at high magnifications while the specimen is being strained.
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At present on leave of absence at Cavendish Laboratory, Cambridge.
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Clarke, D.R., Breakwell, P.R. & Sims, G.D. A bend-testing stage for the scanning electron-microscope. J Mater Sci 5, 873–880 (1970). https://doi.org/10.1007/BF00574859
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DOI: https://doi.org/10.1007/BF00574859