A bend-testing stage for the scanning electron-microscope

Abstract

The design of a stage to bend materials in a scanning electron-microscope (Stereoscan, Cambridge Scientific Instruments Ltd) is described together with examples of its use in the fracture of composite materials. The bend module, when fitted to a large modular stage, can be used with existing scanning electron microscopes and is capable of bending, under increasing load or cyclic loading conditions, rectangular specimens of a maximum size 44×4×1.5 mm, to a maximum strain of 1.5%. Using the module with a standard display system the non-catastrophic stages of deformation and failure can be followed at higher magnification than has previously been possible. When the module is used in conjunction with a fast scanning and display system, deformation and fracture processes may be recorded at high magnifications while the specimen is being strained.