Quantitative depth profiling with AES: application to oxide layers of NiCrFe alloys

  • J. Steffen
  • S. Hofmann
Article

Keywords

Oxide Physical Chemistry Analytical Chemistry Inorganic Chemistry Oxide Layer 

Quantitative Tiefenprofilermittlung mit AES: Anwendung auf Oxidschichten an NiCrFe-Legierungen

References

  1. 1.
    Sanz JM, Hofmann S (1986) Surf Interface Anal 8:147–157Google Scholar
  2. 2.
    Seah MP, Sanz JM, Hofmann S (1981) Thin Solid Films 81:239–246Google Scholar
  3. 3.
    Hofmann S, Sanz JM (1984) Surf Interface Anal 6:78–81Google Scholar
  4. 4.
    Steffen J, Hofmann S (1988) Surf Interface Anal 11:617–626Google Scholar
  5. 5.
    Steffen J, Hofmann S (1987) Fresenius Z Anal Chem 329:250–255Google Scholar
  6. 6.
    Hofmann S (1986) Surf Interface Anal 9:3–20Google Scholar
  7. 7.
    Steffen J, Hofmann S, to be publishedGoogle Scholar
  8. 8.
    Hofmann S, Steffen J (1988) Paper pesented at Symposium on Applied Surface Analysis; 27–29 April 1988, Denver, USA; to be published in Surf Interface AnalGoogle Scholar

Copyright information

© Springer-Verlag 1989

Authors and Affiliations

  • J. Steffen
    • 1
  • S. Hofmann
    • 1
  1. 1.Institut für WerkstoffwissenschaftMax-Planck-Institut für MetallforschungStuttgart 1Federal Republic of Germany

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