Summary
The introduction of Fourier Transform techniques and the increasing use of computers in infrared spectroscopy has made new techniques of investigation available to the spectroscopist, such as photoacoustic spectroscopy (PAS) and IR microscopy. These methods now complement the techniques of specular reflectance and attenuated total reflectance. Thin films on metals, sometimes with a thickness of much less than a micron, can be studied by various specular reflectance methods. The physical basis of the attenuated total reflectance technique (ATR) leads to a penetration of the radiation in the order of a few microns. It is, therefore, especially suitable for the investigation of surfaces and of layers close to the surface. By changing the modulation frequency of the IR radiation, i.e. the mirror velocity of the FTIR spectrometer, photoacoustic spectroscopy (PAS) can be employed to study layers at various depths below the surface of a sample. Therefore, this technique allows depth-profile analysis, so that PAS reveals itself as a complementary method to attenuated total reflectance spectroscopy. Samples with inhomogeneous profiles, e.g. laminated polymer films, can often be prepared as microtome slices perpendicular to the layered structure. Using infrared microscopy it is now possible to investigate different regions of the cross-section easily. The size of the regions that can be studied in this way may be as small as a few microns.
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References
Schrader B (1980) Infrarot- und Ramanspektrometrie. Ullmanns Encyklopädie der technischen Chemie, Bd 5, 4. Aufl. Verlag Chemie, Weinheim
Greenler RG (1966) J Chem Phys 44:310
Francis SA, Ellison AH (1959) J Opt Soc Am 49:131
Boerio JF, Chen SL (1979) Appl Spectrosc 33:121
Rabolt JF (1985) Vibrational spectroscopic studies of thin films. In: Durig JR (ed) Chemical, biological and industrial applications of infrared spectroscopy. Wiley, New York
Molt K (1984) Fresenius Z Anal Chem 319:743–750
Kortüm G (1969) Reflexionsspektroskopie. Springer, Berlin Heidelberg New York
Harrick NJ (1967) Internal reflection spectroscopy. Wiley, New York
Mirabella FM Jr, Harrick NJ (1985) Internal reflection spectroscopy: review and supplement. Harrick Sci Corp, Ossining, USA
Rosencwaig A (1980) Photoacoustics and photoacoustic spectroscopy. Wiley, New York
McClelland JF (1983) Anal Chem 55:89A
Rosencwaig A, Gersho A (1976) J Appl Phys 47:64
Hauser M, Oelichmann J (1988) 6th International Conference on Fourier Transform Spectroscopy, Technical University of Vienna, August 24–28, 1987, Poster A1.14. Mikrochim Acta I:39–43
Nonnenmacher G (1966) Fenster- und Preßlingsmaterialien für den IR-Bereich bis 200 cm−1. UR-Tip 31. Bodenseewerk Perkin-Elmer, Überlingen, FRG
van Krevelen DW (1976) Properties of polymers. Elseviers, Amsterdam
Domininghaus H (1986) Die Kunststoffe und ihre Eigenschaften, 2. Aufl. VDI-Verlag, Düsseldorf
Roush PB, Oelichmann J (1988) 6th International Conference on Fourier Transform Spectroscopy, Technical University of Vienna, Mikrochim Acta 1:49–52
Roush PB (ed) (1987) The design, sample handling, and applications of infrared microscopes. ASTM Spec Techn Publ 949
Schiering DW, Oelichmann J, Rau A (1988) Prinzipien und Anwendungen der Infrarot-Mikroskopie. Angewandte Infrarotspektroskopie, Issue 23. Bodenseewerk Perkin-Elmer, Überlingen, FRG
Kellner R, Weigel Ch (1988) 6th International Conference on Fourier Transform Spectroscopy, Technical University of Vienna, August 24–28, 1987, Poster A3.9. Mikrochim Acta I:163–166
Messerschmidt RG, Ressler G, Reffner JA (1987) 6th International Conference on Fourier Transform Spectroscopy, Technical University of Vienna, August 24–28, 1987, Poster A3.13
Kellner R, Fischböck G, Minich Ch (1986) Mikrochim Acta 1:271
Katon JE, Pacey GE, O'Keefe JF (1986) Anal Chem 58:465A
Schiering DW (1987) Pittsburgh Conference, March 9–13, 1987, Atlantic City. Paper No 350
Hannah RW (1986) Pittsburgh Conference March 10–14, 1986, Atlantic City
Molt K (1981) Fresenius Z Anal Chem 308:321–326
Griffiths PR, de Haseth JA (1986) Fourier transform infrared spectroscopy. Wiley, New York
Garbassi F, Occhiello E (1987) Anal Chim Acta 197:1
Grosse P, Harbecke B, Heinz B, Meyer R, Offenberg M (1986) Appl Phys A39:257
Bubenzer A, Dischler B, Brandt G, Koidl P (1984) Opt Eng 23:153
Hansen WN (1979) J Opt Soc Am 69:264
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Oelichmann, J. Surface and depth-profile analysis using FTIR spectroscopy. Z. Anal. Chem. 333, 353–359 (1989). https://doi.org/10.1007/BF00572327
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DOI: https://doi.org/10.1007/BF00572327