Skip to main content
SpringerLink
Log in

Potentiometry on MIM-structures with a STM

Potentiometrie mit dem Rastertunnelmikroskop an MIM-Strukturen

  • Published:
Fresenius' Zeitschrift für analytische Chemie Aims and scope Submit manuscript

Summary

The scanning tunneling microscope is used to trace simultaneously the topography and the potential distribution in the microslit of an electroformed MIM diode. A thin conductive layer, not seen in a scanning electron microscope is found. The conductivity in the layer cannot be estimated but it seems to be higher than the conductivity perpendicular to the layer plane.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Similar content being viewed by others

References

  1. Blessing R, Pagnia H (1978) Thin Solid Films 52:333

    Google Scholar 

  2. Blessing R, Pagnia H, Sotnik N (1981) Thin Solid Films 85:119

    Google Scholar 

  3. Pagnia H, Schnellbächer J Sotnik N (1985) Phys Status Solidi A 87:709

    Google Scholar 

  4. Pagnia H, Schlemper K, Sotnik N (1987) Mat Lett 5:260

    Google Scholar 

  5. Muralt P, Pohl W (1986) Appl Phys Lett 48:514

    Google Scholar 

  6. Muralt P, Pohl DW, Denk W (1986) IBM J Res Dev 30:443

    Google Scholar 

Download references

Author information

Authors and Affiliations

  1. Institut für Angewandte Physik, Technische Hochschule, Schlossgartenstrasse 7, D-6100, Darmstadt, Federal Republic of Germany

    S. Bräuer, H. Pagnia, M. Rücker, N. Sotnik & W. Wirth

Authors
  1. S. Bräuer
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. H. Pagnia
    View author publications

    You can also search for this author in PubMed Google Scholar

  3. M. Rücker
    View author publications

    You can also search for this author in PubMed Google Scholar

  4. N. Sotnik
    View author publications

    You can also search for this author in PubMed Google Scholar

  5. W. Wirth
    View author publications

    You can also search for this author in PubMed Google Scholar

Rights and permissions

Reprints and permissions

About this article

Cite this article

Bräuer, S., Pagnia, H., Rücker, M. et al. Potentiometry on MIM-structures with a STM. Z. Anal. Chem. 333, 337–339 (1989). https://doi.org/10.1007/BF00572322

Download citation

  • Received:

  • Issue Date:

  • DOI: https://doi.org/10.1007/BF00572322

Keywords

Search

Navigation