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Lanthanum, samarium, and dysprosium fluoride antireflection coatings for silicon photoelectric devices

  • Semiconductor And Insulator Physics
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Russian Physics Journal Aims and scope

Abstract

An investigation was made of the wavelength dependences of light transmission through rare-earth fluoride films and of the effect of using these materials to produce antireflection surface coatings on silicon photoelectric converters. It was established that films of lanthanum, samarium, and dysprosium fluorides are highly transparent in the wavelength range 400–1100 nm and enable the optical reflection coefficient of a silicon surface to be reduced to 3.3–4.0%. It was shown that antireflection layers of these rare-earth fluorides increased the wavelength-resolved value of the short-circuit photoelectric current and the efficiency of a silicon photoelectric converter by more than 43%.

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References

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Additional information

State University, Samara. Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Fizika, No. 4, pp. 7–10, April, 1994.

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Rozhkov, V.A., Petrov, A.I. & Shalimova, M.B. Lanthanum, samarium, and dysprosium fluoride antireflection coatings for silicon photoelectric devices. Russ Phys J 37, 312–314 (1994). https://doi.org/10.1007/BF00560210

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  • DOI: https://doi.org/10.1007/BF00560210

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