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Influence of voltage on the degradation of channels formed in thin film MDM cathodes

  • Physics Of Seiconductors And Insulators
  • Published:
Russian Physics Journal Aims and scope

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Abstract

The influence of voltage on the rate of degradation of formed MDM systems with various upper electrode materials and various dielectric film thicknesses is examined. It is shown that the degradation rate of formed chanels is determined by complex influence of MDM system parameters and deposition conditions. An increase in dielectric thickness permits a significant increase in operating voltage, positioning the maximum of the N-shaped volt-ampere characteristic in a region of higher voltare.

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Authors
  1. V. M. Gaponenko
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Additional information

Tomsk Institute of Automated Systems, Control and Radioelectronics. Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Fizika, No. 10, pp. 44–47, October, 1992.

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Gaponenko, V.M. Influence of voltage on the degradation of channels formed in thin film MDM cathodes. Russ Phys J 35, 930–932 (1992). https://doi.org/10.1007/BF00559886

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  • DOI: https://doi.org/10.1007/BF00559886

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