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Burst noise in non-heated thin film metal-insulator-metal cathodes

  • Physics Of Semiconductors And Dielectrics
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Russian Physics Journal Aims and scope

Abstract

In this paper we present the results of experimental and theoretical studies of the noise characteristics of through and emission currents of thin-film metal-insulator-metal systems based on silicon oxynitride in the temperature range from 4.2 to 300 K and at frequencies at 20 Hz–100 kHz. The noise spectrum of the through current consists of burst and shot noise. In the noise spectrum of the emission current flicker noise and shot noise components predominate. The noise of the through current is not correlated with the noise of the emission current over the full range of investigated temperatures and frequencies. A proposed physical model of the origin of the burst noise in an MIM cathode is based on the assumption of the existence of two types of high conductivity channels in the dielectric: pulsating and nonpulsating. Experimental results are found to be in good agreement with the theoretical calculations.

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Authors
  1. V. N. Davydov
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  2. M. B. Khaskel'berg
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Additional information

Lenin Komsomol Pedagogical Institute, Tomsk. Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Fizika, No. 11, pp. 89–94, November, 1992.

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Davydov, V.N., Khaskel'berg, M.B. Burst noise in non-heated thin film metal-insulator-metal cathodes. Russ Phys J 35, 1070–1074 (1992). https://doi.org/10.1007/BF00559106

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  • DOI: https://doi.org/10.1007/BF00559106

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