Skip to main content
Log in

Phase transformations in TiO2/SiO2 sol-gel films as a function of composition and heat-treatment

  • Papers
  • Published:
Journal of Materials Science Aims and scope Submit manuscript

Abstract

The refractive indices of titania/silica sol-gel films are known to vary over a wide range with composition. However, little work has been done to investigate the possible variations in refractive index that can be produced for one specific sol-gel composition by varying the heat-treatment time and temperature. In this study, three different titania/silica sol-gel compositions containing 40, 60 and 80 mol% titania were studied after thermal processing at temperatures from 175–1050°C for variable lengths of time. The refractive indices and thicknesses of the sol-gel films spin-coated on to silicon wafers were determined using a combined technique of ellipsometry and reflectance spectroscopy. The microstructural differences in the films were investigated using X-ray diffraction and transmission electron microscopy techniques.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Similar content being viewed by others

References

  1. S. M. Melpolder, A. W. West, M. P. Cunningham andR. Sharma, Material Research Society Symposium Proceedings, Vol. 181, “Better Ceramics Through Chemistry”, edited by B. Zelinski, D. E. Clark and D. R. Ulrich (Pittsburgh, 1990) p. 387.

  2. B. E. Yoldas andT. W. O'Keefe,Appl. Opt. 18 (1979) 3133.

    Article  CAS  Google Scholar 

  3. C. J. Brinker andM. S. Harrington,Solar Energy Mater. 5 (1981) 159.

    Article  CAS  Google Scholar 

  4. H. Schroeder,Phys. Thin Films 5 (1969) 87.

    CAS  Google Scholar 

  5. S. Sakka, K. Kamiya andY. Yoko, ACS Symposium Series 360, “Inorganic and Organometallic Polymers”, edited by M. Zeldin, K. J. Wynne and H. R. Allcock (Washington, 1987) p. 345.

  6. C. J. Brinker, in “Proceedings of the 12th Annual Conference on Composites and Advanced Ceramic Materials”, edited by D. E. Clark9 (1988).

  7. F. Bel Hadj, R. Sempere andJ. Phallipou,J. Non-Cryst. Solids 82 (1986) 417.

    Article  CAS  Google Scholar 

  8. B. Cullity, “Elements of X-ray Diffraction” (Addison Wesley, Reading, 1978) pp. 102–3.

    Google Scholar 

  9. “Powder Diffraction File”, Set 21–22, Card 21-1272, edited by W. McClune (JCPDS—International Centre for Diffraction Data, Swarthmore, Pa. 1980).

  10. Ibid, card 21-1276.

  11. F. L. McCracken, “Fortran Program for Analysis of Ellipsometer Measurements”, NBS Technical Note 479 (1969).

  12. P. Rouard,Ann. de Phys. (Paris) 7 (1937) 29.

    Google Scholar 

  13. A. Vasicek, “Optics of Thin Films” (Interscience, New York, 1960).

    Google Scholar 

  14. Idem, in “Ellipsometry in the Measurement of Surfaces and Thin Films”, Vol. 256, edited by E. Passaglia R. Stromberg and J. Kruger (NBS Miscellaneous Publication, Washington, 1964).

    Google Scholar 

  15. S. M. Melpolder andB. K. Coltrain, Materials Research Society Symposium Proceedings, Vol. 121, “Better Ceramics Through Chemistry”, edited by C. J. Brinker, D. E. Clark and D. R. Ulrich (Pittsburgh, 1988) p. 811.

Download references

Author information

Authors and Affiliations

Authors

Rights and permissions

Reprints and permissions

About this article

Cite this article

Melpolder, S.M., West, A.W., Barnes, C.L. et al. Phase transformations in TiO2/SiO2 sol-gel films as a function of composition and heat-treatment. J Mater Sci 26, 3585–3592 (1991). https://doi.org/10.1007/BF00557148

Download citation

  • Received:

  • Accepted:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1007/BF00557148

Keywords

Navigation