Abstract
The refractive indices of titania/silica sol-gel films are known to vary over a wide range with composition. However, little work has been done to investigate the possible variations in refractive index that can be produced for one specific sol-gel composition by varying the heat-treatment time and temperature. In this study, three different titania/silica sol-gel compositions containing 40, 60 and 80 mol% titania were studied after thermal processing at temperatures from 175–1050°C for variable lengths of time. The refractive indices and thicknesses of the sol-gel films spin-coated on to silicon wafers were determined using a combined technique of ellipsometry and reflectance spectroscopy. The microstructural differences in the films were investigated using X-ray diffraction and transmission electron microscopy techniques.
Similar content being viewed by others
References
S. M. Melpolder, A. W. West, M. P. Cunningham andR. Sharma, Material Research Society Symposium Proceedings, Vol. 181, “Better Ceramics Through Chemistry”, edited by B. Zelinski, D. E. Clark and D. R. Ulrich (Pittsburgh, 1990) p. 387.
B. E. Yoldas andT. W. O'Keefe,Appl. Opt. 18 (1979) 3133.
C. J. Brinker andM. S. Harrington,Solar Energy Mater. 5 (1981) 159.
H. Schroeder,Phys. Thin Films 5 (1969) 87.
S. Sakka, K. Kamiya andY. Yoko, ACS Symposium Series 360, “Inorganic and Organometallic Polymers”, edited by M. Zeldin, K. J. Wynne and H. R. Allcock (Washington, 1987) p. 345.
C. J. Brinker, in “Proceedings of the 12th Annual Conference on Composites and Advanced Ceramic Materials”, edited by D. E. Clark9 (1988).
F. Bel Hadj, R. Sempere andJ. Phallipou,J. Non-Cryst. Solids 82 (1986) 417.
B. Cullity, “Elements of X-ray Diffraction” (Addison Wesley, Reading, 1978) pp. 102–3.
“Powder Diffraction File”, Set 21–22, Card 21-1272, edited by W. McClune (JCPDS—International Centre for Diffraction Data, Swarthmore, Pa. 1980).
Ibid, card 21-1276.
F. L. McCracken, “Fortran Program for Analysis of Ellipsometer Measurements”, NBS Technical Note 479 (1969).
P. Rouard,Ann. de Phys. (Paris) 7 (1937) 29.
A. Vasicek, “Optics of Thin Films” (Interscience, New York, 1960).
Idem, in “Ellipsometry in the Measurement of Surfaces and Thin Films”, Vol. 256, edited by E. Passaglia R. Stromberg and J. Kruger (NBS Miscellaneous Publication, Washington, 1964).
S. M. Melpolder andB. K. Coltrain, Materials Research Society Symposium Proceedings, Vol. 121, “Better Ceramics Through Chemistry”, edited by C. J. Brinker, D. E. Clark and D. R. Ulrich (Pittsburgh, 1988) p. 811.
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Melpolder, S.M., West, A.W., Barnes, C.L. et al. Phase transformations in TiO2/SiO2 sol-gel films as a function of composition and heat-treatment. J Mater Sci 26, 3585–3592 (1991). https://doi.org/10.1007/BF00557148
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1007/BF00557148