Journal of Materials Science

, Volume 15, Issue 9, pp 2376–2384 | Cite as

Defect structure and tetrahedral precipitates in sulphur-doped gallium phosphide

  • R. K. Ball
  • P. W. Hutchinson


Transmission electron microscopy has been used to study the defect structure in liquid encapsulated Czochralski GaP doped with 2×1018 S atoms cm−3. Dislocation clusters, stacking faults and precipitates were observed and analysed in as-grown, annealed and zinc diffused materials. In as-grown and annealed GaP both the perfect and faulted dislocation loops were shown to be interstitial in nature while the precipitates were found to be incoherent and tetrahedral in shape. Prolonged zinc diffusion was shown to increase the dislocation density and cause the precipitates to become coherent.


Polymer Zinc Microscopy Electron Microscopy Transmission Electron Microscopy 
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Copyright information

© Chapman and Hall Ltd 1980

Authors and Affiliations

  • R. K. Ball
    • 1
  • P. W. Hutchinson
    • 1
  1. 1.Department of Physical Metallurgy and Science of MaterialsUniversity of BirminghamBirminghamUK

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