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Quantitative analysis of carbide and intermetallic phases in Type 316 stainless steel by X-ray diffraction

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Abstract

Calibration curves for quantitative analysis by X-ray diffraction of precipitates in Type 316 stainless steel have been prepared using nearly “pure” M23C6 carbide and sigma phase. The method was checked by an independent technique using a Quantimet 720 Image Analysing Computer. Agreement of better than ±10% of the amount of precipitates was obtained between the two techniques.

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References

  1. J. K. Lai and J. R. Haigh, Weld. J. Res. Suppl. 58 (1979) 1s.

    Google Scholar 

  2. B. Weiss and R. Stickler, Met. Trans. 3 (1972) 851.

    Google Scholar 

  3. F. C. Hull, Weld J. Res. Suppl. 52 (1973) 104s.

    Google Scholar 

  4. J. K. Lai and A. Wickens, Acta Met. 27 (1979) 217.

    Google Scholar 

  5. J. E. Spruiell and R. E. Gehlbach, Trans. Amer. Nucl. Soc. 15 (1972) 769.

    Google Scholar 

  6. A. F. Giamei and E. J. Freise, Trans. AIME 239 (1967) 1676.

    Google Scholar 

  7. H. P. Klug and L. E. Alexander, “X-ray Diffraction Procedures for Polycrystalline and Amorphous Materials”, 2nd edn. (Wiley, New York, 1974).

    Google Scholar 

  8. J. M. Leitnaker and J. Bentley, Met. Trans. 8A (1977) 1605.

    Google Scholar 

  9. J. K. Lai and M. Meshkat, Met. Sci. 12 (1978) 415.

    Google Scholar 

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Lai, J.K.L., Galbraith, I.F. Quantitative analysis of carbide and intermetallic phases in Type 316 stainless steel by X-ray diffraction. J Mater Sci 15, 1297–1305 (1980). https://doi.org/10.1007/BF00551820

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  • DOI: https://doi.org/10.1007/BF00551820

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