Journal of Materials Science

, Volume 15, Issue 3, pp 670–676 | Cite as

Diffusion of tin (IV) in silicate glazes and glasses

  • R. H. Taylor
  • J. Robertson
  • S. B. Morris
  • J. Williamson
  • A. Atkinson
Papers

Abstract

The diffusion coefficients of Sn(IV) in an aluminosilicate glass and a commercial glaze have been measured from 809 to 1505° C. Two experimental techniques have been used. In one method, single crystals of SnO2 were embedded in either the powdered glass or sealed into a bar of the glass. After the diffusion anneal, the Sn(IV) concentration profile was determined by EPMA. In the other method, radioactive 113Sn was used as a tracer and the profile determined by measuring the X-ray emission. The results gave a good agreement between the two methods. The diffusion coefficients in the glaze ranged from 7×10−20 m2 sec−1 at 809° C to 1.9×10−14 m2 sec−1 at 1250° C and in the glass, from 5.6×10−15 m2 sec−1 at 1307° C to 1.6×10−11 m2 sec−1 at 1505° C.

Keywords

Polymer Silicate Diffusion Coefficient SnO2 Experimental Technique 

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Copyright information

© Chapman and Hall Ltd. 1980

Authors and Affiliations

  • R. H. Taylor
    • 1
  • J. Robertson
    • 1
  • S. B. Morris
    • 2
  • J. Williamson
    • 2
  • A. Atkinson
    • 3
  1. 1.Central Electricity Research LaboratoriesLeatherheadUK
  2. 2.Imperial CollegeLondonUK
  3. 3.Materials Development DivisionAEREHarwellUK

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