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Refractive index and density of Li-, Na- and K-germanosilicate glasses

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Abstract

Refractive index and density measurements in the ternary systems Li2O-SiO2-GeO2, Na2O-SiO2-GeO2 and K2O-SiO2-GeO2 are given. Molar refraction data are correlated to the structure of these glasses. In the Li2O-SiO2-GeO2 system, phase separation occurs which can be suppressed by rapid cooling. In the systems Na2O-SiO2-GeO2 and K2O-SiO2-GeO2 no such phase separation is observed; in these systems the molar refraction data indicate that, contrary to the Li2O-SiO2-GeO2 system, the four-six co-ordination change of Ge4+ is not affected by the presence of SiO2 as second network former.

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Author notes

  1. J. H. J. M. Buster

    Present address: Philips Semiconductor Devices Factory, Nijmegen, The Netherlands

Authors and Affiliations

  1. Philips Research Laboratories, Eindhoven, The Netherlands

    H. Verweij & J. H. J. M. Buster

  2. Twente University of Technology, Enschede, The Netherlands

    G. F. Remmers

Authors
  1. H. Verweij
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  2. J. H. J. M. Buster
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  3. G. F. Remmers
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Verweij, H., Buster, J.H.J.M. & Remmers, G.F. Refractive index and density of Li-, Na- and K-germanosilicate glasses. J Mater Sci 14, 931–940 (1979). https://doi.org/10.1007/BF00550724

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