Abstract
Differential thermal analysis (DTA) and electron diffraction techniques have been used to characterize thin chalcogenide alloy films by comparison with the properties of bulk alloys from which they were deposited. It is shown that the DTA technique is a valuable adjunct to structural studies on thin films since it helps to differentiate between the two non-crystalline states, amorphous and vitreous or glassy. It is observed that the former does not produce reproducible reversible threshold switching from a high impedance to a low impedance state whereas the latter does.
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Bosnell, J.R., Savage, J.A. Differential thermal analysis, structure and switching of thin chalcogenide films. J Mater Sci 7, 1235–1243 (1972). https://doi.org/10.1007/BF00550688
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DOI: https://doi.org/10.1007/BF00550688