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Three-dimensional analytical expressions of strain gauge coefficients of infinitely thick polycrystalline metal films

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Abstract

Theoretical equations for the longitudinal and transverse strain coefficients of resistivity in infinitely-thick polycrystalline films are derived from a three-dimensional conduction model; the changes in the grain sizes in the directions parallel and perpendicular to the applied electric field are considered. Numerical calculations are performed in the typical case of silver, the strain coefficients are found to depend mainly on the grain parameter v.

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Authors and Affiliations

  1. Laboratoire d'Electronique, Université de Nancy-I, 54037, Nancy, France

    C. R. Pichard, C. R. Tellier & A. J. Tosser

Authors
  1. C. R. Pichard
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  2. C. R. Tellier
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  3. A. J. Tosser
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Pichard, C.R., Tellier, C.R. & Tosser, A.J. Three-dimensional analytical expressions of strain gauge coefficients of infinitely thick polycrystalline metal films. J Mater Sci 15, 2991–2994 (1980). https://doi.org/10.1007/BF00550366

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  • DOI: https://doi.org/10.1007/BF00550366

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