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Size effects of polycrystalline tin films

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Abstract

The electrical properties of polycrystalline tin films evaporated onto a cooled quartz substrate were examined in situ and in vacuum. The relationship between internal size effect and annealing temperature was considered. It was found that the parameter α* of grain-boundary scattering decreased as the annealing temperature was increased.

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Authors and Affiliations

  1. Institute of Physics, Wrocław Technical University, Wybrzeże Wyspiańskiego 27, 50-370, Wrocław, Poland

    B. Stolecki, F. Warkusz, A. Borodziuk-Kulpa & C. Wesołowska

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  1. B. Stolecki
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  2. F. Warkusz
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  3. A. Borodziuk-Kulpa
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  4. C. Wesołowska
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Stolecki, B., Warkusz, F., Borodziuk-Kulpa, A. et al. Size effects of polycrystalline tin films. J Mater Sci 14, 1349–1352 (1979). https://doi.org/10.1007/BF00549307

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  • DOI: https://doi.org/10.1007/BF00549307

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