Abstract
Electrical resistivity and temperature coefficient of resistivity of polycrystalline aluminium films deposited onto calcite substrates have been measured in situ. It was observed that films deposited at 130° C substrate temperature show reversible and reproducible behaviour with thermal cycling. The grain-boundary scattering theory of Mayadas and Shatzkes reproduces the experimental observations quite faithfully with the coefficient of specular reflection p=0 and grain-boundary reflection coefficient R=0.38 indicating that the grain-boundary scattering plays a significant role in electron transport in aluminium film deposited on to calcite substrate.
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Bandyopadhyay, S.K., Pal, A.K. Grain-boundary scattering in aluminium films deposited on to calcite substrate. J Mater Sci 14, 1321–1325 (1979). https://doi.org/10.1007/BF00549303
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DOI: https://doi.org/10.1007/BF00549303