Abstract
Changes in Curie temperature (ΔT c, electrical resistivity (Δϱ/ϱ) and volume (ΔV/V) caused by isochronal annealing in as-quenched and pre-annealed Fe27Ni53P14B6 metallic glasses were compared. It was found that the ΔT c against annealing temperature (T a) curves in as-quenched and pre-annealed samples are very similar to the Δϱ/ϱ against T a curves. Particularly, almost a linear relationship was observed between ΔT c and Δϱ/ϱ in the pre-annealed sample. The results strongly suggest that the origins of both ΔT c and Δϱ/ϱ during structural relaxation in the pre-annealed sample are attributed to identical, reversible, short-range ordering.
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Komatsu, T., Matusita, K. & Yokota, R. Correlation between changes in Curie temperature and electrical resistivity during structural relaxation in Fe27Ni53P14B6 metallic glass. J Mater Sci 20, 3271–3276 (1985). https://doi.org/10.1007/BF00545194
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DOI: https://doi.org/10.1007/BF00545194