Journal of Materials Science

, Volume 20, Issue 9, pp 3191–3200 | Cite as

Electrical and optical properties of single crystalline α-Al2O3 doped with nickel

  • John-Sea Chen
  • F. A. Kröger


Nickel, substituting for aluminium in α-Al2O3 acts as an acceptor with a level ∼2.46 eV above the conduction band if a large polaron model applies, ≅ 2.57eV−H(μ h) above the band if a small polaron model applies. It is present as Ni3+ at high, and as Ni2+ at low, oxygen pressures, the concentration of Ni3+ being reduced to one-half of its high \(p_{o_2 } \) value at \(p_{o_2 } \)=1 Pa. Analysis of the data provides proof that the native defect compensating the charge of Ni2+ (=ni al ) is V O 2. , Al i 3. being a minority species; H F,Al−1/2H s=121 kJ mol−1.


Oxygen Pressure Native Defect Minority Species Empirical Potential Polaron Model 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.


Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.


  1. 1.
    F. A. Kröger, Solid State Ionics 12 (1984) 189.CrossRefGoogle Scholar
  2. 2.
    S. A. Marshall, Bull. Am. Phys. Soc. 5 (1960) 158.Google Scholar
  3. 3.
    S. A. Marshall, T. T. Kikuchi and A. R. Reinberg, Phys. Rev. 125 (1962) 453.CrossRefGoogle Scholar
  4. 4.
    S. Geschwind and J. P. Remeika, J. Appl. Phys. 33 (1962) 370.CrossRefGoogle Scholar
  5. 5.
    R. Müller and Hs. H. Günthard, J. Chem. Phys. 44 (1966) 365.CrossRefGoogle Scholar
  6. 6.
    D. S. McClure, ibid. 36 (1962) 2757.CrossRefGoogle Scholar
  7. 7.
    K. C. Radford and P. L. Pratt, Proc. Brit. Ceram. Soc. 15 (1970) 185.Google Scholar
  8. 8.
    H. H. Tippins, Phys. Rev. B 1 (1970) 126.CrossRefGoogle Scholar
  9. 9.
    H. A. Wang, C. H. Lee, F. A. Kröger and R. T. Cox, ibid. 27 (1983) 3821.CrossRefGoogle Scholar
  10. 10.
    C. H. Lee and F. A. Kröger, J. Amer. Ceram. Soc. in press.Google Scholar
  11. 11.
    M. M. El-Aiat, L. D. Hou, S. K. Tiku, H. A. Wang and F. A. Kröger, ibid. 64 (1981) 174.CrossRefGoogle Scholar
  12. 12.
    P. Odier, J. C. Rifflet and J. P. Loup, J. Mater. Sci. 19 (1984) 2121.CrossRefGoogle Scholar
  13. 13.
    G. J. Dienes, D. O. Welch, C. R. Fisher, R. D. Hatcher, O. Lazareth and M. Samberg, Phys. Rev. B 11 (1975) 3060.CrossRefGoogle Scholar
  14. 14.
    C. R. A. Catlow, R. James, M. C. Mackrodt and R. F. Stewart, ibid. 25 (1982) 1006.CrossRefGoogle Scholar
  15. 15.
    B. V. Dutt, J. P. Hurrell and F. A. Kröger, J. Amer. Ceram. Soc. 58 (1975) 420.Google Scholar
  16. 16.
    S. K. Tiku and F. A. Kröger, ibid. 63 (1980) 31.CrossRefGoogle Scholar
  17. 17.
    S. K. Mohapatra, S. K. Tiku and F. A. Kröger, ibid. 62 (1979) 50.Google Scholar
  18. 18.
    D. L. Dexter, Phys. Rev. 101 (1956) 48.CrossRefGoogle Scholar
  19. 19.
    Critical Tables.Google Scholar

Copyright information

© Chapman and Hall Ltd 1985

Authors and Affiliations

  • John-Sea Chen
    • 1
  • F. A. Kröger
    • 1
  1. 1.Department of Materials ScienceUniversity of Southern CaliforniaLos AngelesUSA

Personalised recommendations