Abstract
A contactless r.f. resistivity technique is shown to be well suited to the measurement of room temperature a-axis resistivities in lamellar compounds, particularly those of graphite. The method is used to investigate the relative damage induced by different techniques employed in cutting of samples.
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Nato exchange visitor, University of Nancy, France.
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Zeller, C., Foley, G.M.T. & Vogel, F.L. The effect of extrinsic defects in pyrolytic graphite on the a-axis resistivity. J Mater Sci 13, 1114–1118 (1978). https://doi.org/10.1007/BF00544708
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DOI: https://doi.org/10.1007/BF00544708