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Association of polarized light metallography with quantitative image analysis for the characterization of microstructures

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Abstract

Some alloys, such as titanium alloys, exhibit microstructures difficult to etch and consequently difficult to characterize quantitatively. A new method is presented to solve such problems, consisting of associating polarized light microscopy with the techniques of image analysis. The problems set and the solutions obtained by the method are discussed in the case of acicular α-titanium microstructures. The method can also be applied to other optically anisotropic materials.

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Authors and Affiliations

  1. Laboratoire de Science et Génie des Matériaux Métalliques, CNRS, U.A. 159, Ecole des Mines, Parc de Saurupt, 54042, Nancy Cedex, France

    M. Calvo, E. Gautier & A. Simon

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  1. M. Calvo
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  2. E. Gautier
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  3. A. Simon
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Calvo, M., Gautier, E. & Simon, A. Association of polarized light metallography with quantitative image analysis for the characterization of microstructures. J Mater Sci 26, 1236–1246 (1991). https://doi.org/10.1007/BF00544461

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  • DOI: https://doi.org/10.1007/BF00544461

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