References
P. B. Hirsch, A. Howie, R. B. Nicholson, D. W. Pashley and M. J. Whelan, “Electron Microscopy of Thin Crystals” (Butterworths, London, 1965).
W. Jones and J. O. Williams, J. Mater. Sci. 10 (1975) 379.
J. R. White, ——ibid 9 (1974) 1860.
M. J. Goringe and U. Valdrè, Proc. Roy. Soc. A295 (1966) 192.
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White, J.R. The change in deviation parameter on crossing a phase or twin boundary. J Mater Sci 10, 541–543 (1975). https://doi.org/10.1007/BF00543700
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DOI: https://doi.org/10.1007/BF00543700