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The change in deviation parameter on crossing a phase or twin boundary

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References

  1. P. B. Hirsch, A. Howie, R. B. Nicholson, D. W. Pashley and M. J. Whelan, “Electron Microscopy of Thin Crystals” (Butterworths, London, 1965).

    Google Scholar 

  2. W. Jones and J. O. Williams, J. Mater. Sci. 10 (1975) 379.

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  3. J. R. White, ——ibid 9 (1974) 1860.

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  4. M. J. Goringe and U. Valdrè, Proc. Roy. Soc. A295 (1966) 192.

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White, J.R. The change in deviation parameter on crossing a phase or twin boundary. J Mater Sci 10, 541–543 (1975). https://doi.org/10.1007/BF00543700

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  • DOI: https://doi.org/10.1007/BF00543700

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