Literature cited
M. A. Blokhin, Methods of X-Ray Spectral Investigations [in Russian], Fizmatgiz, Moscow (1959), p. 351.
W. B. Perry and W. L. Jolly, “Valence electron binding energies of some silicon compounds from x-ray photoelectron spectroscopy,” J. Electron. Spectrosc. Related Phenom., 6, No. 4, 219–232 (1974).
S. Evans, J. C. Green, P. J. Joachim, et al., “Electronic structures of the group IVb tetramethyls by helium-(I) photoelectron spectroscopy,” J. Chem. Soc., Faraday Trans. II, 68, No. 5, 905–911 (1972).
D. Turner, C. Baker, A. Baker, and C. Brundl, Molecular Photoelectron Spectroscopy, Wiley-Interscience, London (1970), p. 457.
V. I. Nefedov, “Valence electron levels of chemical compounds,” Progress in Science and Technology, Vol. 3, Series on Molecular Structure and Chemical Bonding [in Russian], VINITI, Moscow (1975), p. 177.
C. Coulson, Valence, Oxford Univ. Press (1975).
A. Baker and D. Betteridge, Photoelectron Spectroscopy, Pergamon Press (1972).
L. V. Gurvich, G. V. Karachevtsev, V. N. Kondrat'ev, et al., Cleavage Energies of Chemical Bonds. Ionization Potentials and Electron Affinities [in Russian], Nauka, Moscow (1974), p. 351.
M. M. Tatevosyan, A. T. Shuvaev, A. P. Zemlyanov, et al., “X-Ray spectral investigation of the electronic structures of Ph4Si and Ph3SiH,” Zh. Struk. Khim., 18, No. 4, 684–686 (1977).
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Translated from Teoreticheskaya i Éksperimental'naya Khimiya, Vol. 20, No. 3, pp. 369–372, May–June, 1984.
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Shubaev, A.T., Tatevosyan, M.M., Kopylov, V.M. et al. X-ray Si ß spectrum and electronic structure of tetramethylsilane. Theor Exp Chem 20, 345–348 (1984). https://doi.org/10.1007/BF00521331
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DOI: https://doi.org/10.1007/BF00521331