Theoretical and Experimental Chemistry

, Volume 22, Issue 2, pp 224–226 | Cite as

Structure of the surface of synthetic titanosilica

  • V. I. Zarko
  • Yu. I. Gorlov
  • V. V. Brei
  • G. M. Kozub
  • A. I. Senkevich
  • A. A. Chuiko
Article

Abstract

X-ray photoelectron spectroscopy (ESCA), high-resolution NMR (on 29Si nuclei), and mass spectrometry have been used to investigate a synthetic titanosilica (TS) containing 28–37% titanium dioxide. It has been found that titanium siloxane bonds can form in synthetic TS, regardless of the fact that silicon-oxygen polyhedra predominate in the surface layer. The presence of titanium ions in the surface layer of TS leads to its significant rearrangement; this reduces significantly the concentration of centers for the strong adsorption of water.

Keywords

Spectroscopy Titanium Mass Spectrometry Dioxide Surface Layer 

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Copyright information

© Plenum Publishing Corporation 1986

Authors and Affiliations

  • V. I. Zarko
    • 1
  • Yu. I. Gorlov
    • 1
  • V. V. Brei
    • 1
  • G. M. Kozub
    • 1
  • A. I. Senkevich
    • 1
  • A. A. Chuiko
    • 1
  1. 1.L. V. Pisarzhevskii Institute of Physical ChemistryAcademy of Sciences of the Ukrainian SSRKiev

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