Abstract
Thermal diffusivity and thermal expansion in high-conducting solids can be measured by means of a capacitance method, which turns out to be simple, reliable, and accurate and yields the first property with an accuracy of ∼1% and the second one with an accuracy of ∼2%. Preliminary results, which are consistent with the literature, have been obtained on pure aluminum (99.999%) and on commercial copper, both at near room temperature.
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Sparavigna, A., Giachello, G., Omini, M. et al. High-sensitivity capacitance method for measuring thermal diffusivity and thermal expansion: Results on aluminum and copper. Int J Thermophys 11, 1111–1126 (1990). https://doi.org/10.1007/BF00500564
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DOI: https://doi.org/10.1007/BF00500564