Fresenius' Zeitschrift für analytische Chemie

, Volume 301, Issue 4, pp 309–309 | Cite as

Determination of traces of copper in silicon by AAS

  • M. Taddia
Short Communications

Key Words

Best. von Kupfer in Silicium Spektalphotometrie. Atomabsorption Spuren 

Bestimmung von Kupferspuren in Silicium durch AAS

Copyright information

© Springer-Verlag 1980

Authors and Affiliations

  • M. Taddia
    • 1
  1. 1.Chemical Institute of the UniversityBolognaItaly

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