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Determination of traces of copper in silicon by AAS

Bestimmung von Kupferspuren in Silicium durch AAS

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  1. Chemical Institute of the University, 2 Via Selmi, I-40126, Bologna, Italy

    M. Taddia

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  1. M. Taddia
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Taddia, M. Determination of traces of copper in silicon by AAS. Z. Anal. Chem. 301, 309 (1980). https://doi.org/10.1007/BF00491428

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  • DOI: https://doi.org/10.1007/BF00491428

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