Zerstörungsfreie Phasenanalyse dünner Oberflächenschichten mittels Konversionselektronen

  • W. Meisel
  • U. Stumm
  • P. Gütlich
Vorträge und Poster Dünne Filme

Non-destructive phase analysis of thin surface layers by conversion electrons

Summary

By use of an appropriate gamma radiation, conversion electrons may be produced by Mössbauer effect also in a depth below the sample surface deeper than the free path for inelastic electron scattering. Because the Mössbauer spectrum of the conversion electrons reflects the local phase composition, the recording of all electrons escaping from the surface allows an integral phase analysis of a layer of some 10–100 nm thickness. If only electrons within a narrow range of energy are recorded, a depth selective phase analysis is possible. The applicability of these two techniques of conversion electron spectroscopy is demonstrated by a few examples concerning oxidation and passivation of steel. Contrary to usual CEMS experiments, where always isotopically enriched samples have been used, natural samples were employed in the described experiments.

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Copyright information

© Springer-Verlag 1987

Authors and Affiliations

  • W. Meisel
    • 1
  • U. Stumm
    • 1
  • P. Gütlich
    • 1
  1. 1.Institut für Anorganische und Analytische ChemieJohannes-Gutenberg-UniversitätMainzBundesrepublik Deutschland

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