Surface analysis by work function measurements in a Scanning Auger Microprobe

  • G. Bachmann
  • H. Oechsner
  • J. Scholtes
Lectures and Posters Depeth Profile and Distribution Analysis


Two different methods of electron work function measurements, the diode and the onset method, are described. Both methods can easily be incorporated in existing analytical equipments. With the diode method the work function changes are determined from the shift of the break points of characteristic retarding field lines. The onset method uses the shift of the onset of the secondary electron energy distribution due to work function changes. Several experimental examples are presented, which served as test for the work function measurement and mapping capabilities.


Inorganic Chemistry Electron Energy Auger Energy Distribution Work Function 

Oberflächenanalyse durch Austrittsarbeitsmessungen in einer Scanning-Auger-Mikrosonde


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Copyright information

© Springer-Verlag 1987

Authors and Affiliations

  • G. Bachmann
    • 1
  • H. Oechsner
    • 1
  • J. Scholtes
    • 1
  1. 1.Fachbereich Physik der Universität KaiserslauternKaiserslauternFederal Republic of Germany

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