Zeit- und winkelaufgelöste Untersuchungen an Metalloberflächen durch mikroprozessorgesteuerte Simultanspektroskopie

  • G. Gauglitz
  • R. Mauser
  • D. Oelkrug
Vorträge und Poster Methoden und Instrumentelle Entwicklungen

Time and angle resolved examinations at metal surfaces by microprocessor controlled fast scanning diode array spectroscopy

Summary

A fast scanning diode array spectrometer was used to analyze fast chemical and physical reactions at surfaces. For real-time process control a multi-tasking and multiuser operating system was implemented. Processes critical with respect to time could be observed at surfaces of metals at high sensitivity in the wavelength region 250 to 620 nm by use of fiber optics. The spectral data can be stored in memory obtaining repetition rates smaller than 25 ms. The apparatus records time resolved reflectance spectra. The changes of the optical signals of potential jump methods, during cyclic voltammetry, or thermal oxidation can be reliably interpreted. Besides, angular resolved measurements can be carried out.

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Copyright information

© Springer-Verlag 1987

Authors and Affiliations

  • G. Gauglitz
    • 1
  • R. Mauser
    • 1
  • D. Oelkrug
    • 1
  1. 1.Institut für Physikalische und Theoretische ChemieTübingenBundesrepublik Deutschland

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