Scanning tunneling microscopy: A powerful tool for surface analysis

  • G. F. A. van de Walle
  • B. J. Nelissen
  • L. L. Soethout
  • H. van Kempen
Lectures and Posters Methods and Instrumental Developments


The invention of the Scanning Tunneling Microscope (STM) has opened a new area of surface analysis. A description of the principle of operation is given in this paper. Also the technical problems encountered and their solution are described. Two examples demonstrating the possibilities of the STM are presented: topographic and spectroscopic measurements on a stepped Ni (111) surface and photoconductive measurements on GaAs.


Microscopy Physical Chemistry Analytical Chemistry Inorganic Chemistry GaAs 
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Raster-Tunnel-Mikroskopie: Ein leistungsfähiges Gerät zur Oberflächenanalyse


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Copyright information

© Springer-Verlag 1987

Authors and Affiliations

  • G. F. A. van de Walle
    • 1
  • B. J. Nelissen
    • 1
  • L. L. Soethout
    • 1
  • H. van Kempen
    • 1
  1. 1.Research Institute for MaterialsUniversity of NijmegenED NijmegenThe Netherlands

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