Abstract
Picosecond excite-probe studies are performed on a single quantum well waveguide modulator giving a direct measure of the escape of photogenerated carriers from a quantum well. Both the effects of exciton saturation and external field screening are observed in the transient transmission change. The results are consistent with the escape of carriers by thermionic emission.
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Bambha, R., Hutchings, D.C., Snelling, M.J. et al. Carrier escape dynamics in a single quantum well waveguide modulator. Opt Quant Electron 25, S965–S971 (1993). https://doi.org/10.1007/BF00430338
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DOI: https://doi.org/10.1007/BF00430338