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FTIR spectroscopy and X-ray diffraction characterization of Nb doped sol-gel silica

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Abstract

Nb doped silica was prepared by the sol-gel method. The experimental variables were the pH (acidic and basic) and the Nb concentration (1.0–10.0 wt.%). The samples were calcined at 300°C and 600°C and analyzed by XRD, and FTIR. The TGA and DTA of the gels were also performed. From the XRD results the radial distribution function allowed us to establish the existence of the Si−O−Nb bond in the powders.

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Méndez-Vivar, J., Bosch, P. & Lara, V.H. FTIR spectroscopy and X-ray diffraction characterization of Nb doped sol-gel silica. J Sol-Gel Sci Technol 6, 257–262 (1996). https://doi.org/10.1007/BF00402696

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  • DOI: https://doi.org/10.1007/BF00402696

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