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Ion scattering spectroscopy and scanning tunneling microscopy: A powerful combination for surface structure analysis

  • Surface Physics 1991
  • Published:
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Abstract

Low-energy ion backscattering and scanning tunneling microscopy (STM) have been used in combination to get better insight into the field of surface crystallography. The synergic effectiveness resulting from the complementing character of the two methods has been exemplified at clean NiAl(111) and for oxygen and nitrogen adsorption on Cu(110). The position of the atom cores is accessible by the low-energy noble gas impact collision ion scattering spectroscopy with neutral detection (NICISS). As a technique averaging over a macroscopic area of the sample, NICISS is better suited to supply information on features of completely developed phases, either on clean or adsorbate saturated surfaces. Additional information, on the other hand, can be gained by scanning tunneling microscopy (STM), which as a powerful local probe may be used to image surfaces with atomic resolution and to monitor defects, steps and the growth kinetics of e.g. adsorption-induced phase changes.

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  1. IGV-KFA Jülich, Postfach 1913, W-5170, Jülich, Fed. Rep. Germany

    H. Niehus

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Niehus, H. Ion scattering spectroscopy and scanning tunneling microscopy: A powerful combination for surface structure analysis. Appl. Phys. A 53, 388–402 (1991). https://doi.org/10.1007/BF00348151

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