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Applied Physics A

, Volume 53, Issue 5, pp 349–355 | Cite as

Recent advances in scanning tunneling microscopy involving magnetic probes and samples

  • R. Wiesendanger
  • D. Bürgler
  • G. Tarrach
  • T. Schaub
  • U. Hartmann
  • H. -J. Güntherodt
  • I. V. Shvets
  • J. M. D. Coey
Surface Physics 1991

Abstract

We report on recent developments in the field of STM performed with magnetic probes and samples. The choice of appropriate magnetic sensors and their in situ preparation will be described. We further focus on the information obtained in spin-polarized scanning tunneling microscopy (SPSTM) as well as on possible modes of operation for simultaneous acquisition of topographic and magnetic data. The prospects for SPSTM and related magnetic sensitive SXM techniques will be discussed.

PACS

75.30 Pd 61.16 Di 75.25 tz 75.50 El 

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Copyright information

© Springer-Verlag 1991

Authors and Affiliations

  • R. Wiesendanger
    • 1
  • D. Bürgler
    • 1
  • G. Tarrach
    • 1
  • T. Schaub
    • 1
  • U. Hartmann
    • 1
  • H. -J. Güntherodt
    • 1
  • I. V. Shvets
    • 2
  • J. M. D. Coey
    • 2
  1. 1.Department of PhysicsUniversity of BaselBaselSwitzerland
  2. 2.Department of Physics, Trinity CollegeUniversity of DublinDublin-2Ireland

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