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Phase diagram and LPE growth of strongly Sn- and Te-doped InGaAs

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Abstract

Sn and Te are used as n-type dopants in LPE In0.53Ga0.47 As contact layers, and carrier concentrations up to 2.2·1019 cm−3 are obtained for both dopants. The distribution coefficients are kSn=(1.55±0.10)·10−3 and kTe≈0.11, respectively. With Sn a better control of the doping level is achieved than with Te, but the large amount of Sn necessary strongly affects the phase diagram. In order to facilitate the growth of InGaAs:Sn, the phase equilibria in the system In-Ga-As-Sn near 600° C are established. The liquid interaction parameters α(Ga-Sn) and α(As-Sn) are determined as 700 and -2050 cal/mole, respectively.

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Kuphal, E. Phase diagram and LPE growth of strongly Sn- and Te-doped InGaAs. Appl. Phys. A 59, 441–443 (1994). https://doi.org/10.1007/BF00331726

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  • DOI: https://doi.org/10.1007/BF00331726

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