Abstract
The possibility of using the mass-reflectron as an analyzer for the kinetic energy of charged particles is demonstrated. The reflectron operating regime can be changed by varying the voltage across the reflecting system. The geometry of the system, in some cases, can remain the same. The time-of-flight focusing property of the analyzer is demonstrated for the case where ions of various initial energies simultaneously escape the same equipotential surface of the simple acceleration system.
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Moskovets, E.V. Mass-reflectron as an ion energy analyzer. Appl. Phys. B 54, 556–561 (1992). https://doi.org/10.1007/BF00325526
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DOI: https://doi.org/10.1007/BF00325526