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Repeated significance tests with biased coin allocation schemes
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  • Published: November 1986

Repeated significance tests with biased coin allocation schemes

  • Nancy E. Heckman1 

Probability Theory and Related Fields volume 73, pages 627–635 (1986)Cite this article

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  • 1 Citations

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Summary

Suppose that the responses to two treatments are from a single parameter exponential family. Treatments are allocated sequentially using a biased coin design (that is, the probability that the (n+1)-st subject is assigned to treatment A is a function of the proportion of the first n subjects that have been assigned to treatment A). Asymptotic error probabilities are found for a repeated significance test of the hypothesis that the two treatments elicit the same response.

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References

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Authors and Affiliations

  1. Department of Statistics, The University of British Columbia, 2021 West Mall, V6T 1W5, Vancouver, Canada

    Nancy E. Heckman

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  1. Nancy E. Heckman
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Cite this article

Heckman, N.E. Repeated significance tests with biased coin allocation schemes. Probab. Th. Rel. Fields 73, 627–635 (1986). https://doi.org/10.1007/BF00324857

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  • Received: 20 February 1985

  • Issue Date: November 1986

  • DOI: https://doi.org/10.1007/BF00324857

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Keywords

  • Stochastic Process
  • Probability Theory
  • Significance Test
  • Mathematical Biology
  • Error Probability
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