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Picosecond photorefractive diffraction in CdTe at 1 μm

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Abstract

Using a ps-transient grating technique the contribution of the ps-photorefractive effect to the first-order probe-beam diffraction signal has been studied in CdTe at 1 μm investigating diffraction kinetics at different sample orientations in the thin grating regime. A fast photorefractive grating formation time during the pump pulses and a characteristic decay time of 600 ps, shorter than the free-carrier lifetime, have been observed.

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Authors and Affiliations

  1. Department of Physics, Humboldt-University, Invalidenstr. 110, O-1040, Berlin, Fed. Rep. Germany

    I. Rückmann & J. Kornack

  2. Department of Physics, Vilnius University, Sauletekio al. 10, 2054, Vilnius, Lithuania

    J. Kolenda & M. Petrauskaus

  3. Optical Institute, Technical University Berlin, Hardenbergstr. 34, W-1000, Berlin 12, Fed. Rep. Germany

    Y. Ding & B. Smandek

Authors
  1. I. Rückmann
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  2. J. Kornack
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  3. J. Kolenda
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  4. M. Petrauskaus
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  5. Y. Ding
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  6. B. Smandek
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Rückmann, I., Kornack, J., Kolenda, J. et al. Picosecond photorefractive diffraction in CdTe at 1 μm. Appl. Phys. A 55, 30–32 (1992). https://doi.org/10.1007/BF00324598

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  • DOI: https://doi.org/10.1007/BF00324598

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