Abstract
The instrumentation necessary for analytical investigations in the nanometer region is presented. Its possibilities and limits with respect to dose compatibility of objects are discussed. Several examples are given of the efficiency of analytical transmission microscopy for modern solid state investigations.
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Otten MT (1993) Ultramicroscopy 48:77
Zaluzec NJ (1979) Introduction to analytical EM. Plenum Press, New York, p 121
Goldstein JI, Williams DB, Cliff G (1986) Principles of analytical EM. Plenum Press, New York, p 155
Foitzik AH, Scars JS, Xiao SQ, Heuer AH (1993) Ultramicroscopy 50:207
Eibl O (1993) Ultramicroscopy 50:179
Thomas J (1992) Private communication
Colliex C (1991) Microsc Microanal Microstruct 2:403
Batson PE (1991) Microsc Microanal Microstruct 2:395
Krivanek OL (1989) Ultramicroscopy 28:118
Egerton RF, Yang YY, Cheng SC (1993) Ultramicroscopy 48:239
Rose A (1948) Adv Electron 1:131
Cazaux J (1985) Appl Surf Sci 20:457
Doyle S, Mattern N, Pitschke W, Weise G, Bauer HD (1993) Thin Solid Films (in press)
Schneider R, Woltersdorf J, Pippel E, Hähnel A, Röder A, Syrowatka F (1993) 7. Tag, Festkörperanalytik Chemnitz: 202
Ahn CC, Krivanek OL (1983) EELS Atlas, Gatan
Täschner C, Leonhardt A, Schönherr M, Wolf E, Henke J (1991) Mater Sci Eng A 139:67
Hillebrandt R, Neumann W, Heydenreich J (1979) Ultramicrosc 4:305
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Röder, A., Bauer, HD. Analytical transmission electron microscopy in the nanometer-region. Fresenius J Anal Chem 349, 122–130 (1994). https://doi.org/10.1007/BF00323235
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DOI: https://doi.org/10.1007/BF00323235