Abstract
The amorphous phase of SiO2 produced upon recovery of shock-compressed quartz demonstrates a wide range of refractive indices which can be correlated to the shock state. Both infra-red absorption spectra and X-ray diffraction patterns indicate that the shock-produced amorphous SiO2 has a statistically more-random atomic distribution and longer Si-O and shorter Si-Si separation than does fused silica. By accounting for phase transformation, the calculated values of the shock and residual temperature are much higher than those obtained by Wackerle (1962) to a pressure of 700 kbar. Our results are consistent with experimental ones.
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Mashimo, T., Nishii, K., Sōma, T. et al. Some physical properties of amorphous SiO2 synthesized by shock compression of α quartz. Phys Chem Minerals 5, 367–377 (1980). https://doi.org/10.1007/BF00307545
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DOI: https://doi.org/10.1007/BF00307545