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Atomic force microscopy on epitaxially crystallized isotactic polypropylene

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Summary

Contact faces of thin films of α-phase isotactic polypropylene epitaxially crystallized on benzoic acid are examined by atomic force microscopy (AFM). The AFM images reveal the lamellar structure as well as the methyl side group pattern, thus enabling the discrimination between two structurally different contact surfaces in favour of the ‘four’ face type, with one methyl group per helix turn exposed. Furthermore it has been verified, that the observed helices are right-handed.

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Author notes

  1. S. N. Magonov

    Present address: Institute of Chemical Physics of the USSR Academy of Sciences, Kosygin ul. 4, SU-117977, Moscow, USSR

Authors and Affiliations

  1. Institut Charles Sadron (CRM-EAHP), CNRS, Université Louis Pasteur, 6, rue Boussingault, F-67083, Strasbourg Cedex, France

    B. Lotz & J.-C. Wittmann

  2. Freiburger Material-Forschungszentrum FMF, Universität, Stefan-Meier-Strasse 31, W-7800, Freiburg, Federal Republic of Germany

    W. Stocker, S. N. Magonov & H.-J. Cantow

  3. Institut für Makromolekulare Chemie, Universität, Stefan-Meier-Strasse 31, W-7800, Freiburg, Federal Republic of Germany

    W. Stocker & H.-J. Cantow

Authors
  1. B. Lotz
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  2. J.-C. Wittmann
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  3. W. Stocker
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  4. S. N. Magonov
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  5. H.-J. Cantow
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Additional information

Dedicated cordially to Prof. Henry Benoît to his 70th birthday

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Lotz, B., Wittmann, JC., Stocker, W. et al. Atomic force microscopy on epitaxially crystallized isotactic polypropylene. Polymer Bulletin 26, 209–214 (1991). https://doi.org/10.1007/BF00297529

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  • DOI: https://doi.org/10.1007/BF00297529

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