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Atomic force microscopy on polymers and polymer related compounds

5. Carbon fibers

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Summary

Results of Atomic Force Microscopy (AFM) on carbon fibers from polyacrylonitrile and pitch are presented in comparison with Scanning Electron Microscopy (SEM) and Scanning Tunneling Microscopy (STM) images. Single fiber surfaces and their crosssections have been imaged on scales from microns to nanometers. Morphological details beyond the resolution of SEM were revealed by AFM and STM. Grain-type structure was verified on surface of numerous nanofibrils orlented along the main fiber direction. Grains are bigger on pitch-based fibers generally, and on fibers of both types after treatment at higher temperatures. In the atomic scale AFM images traces of graphitic structure were recorded. AFM artefacts on rough surfaces are demonstrated. ac19920414

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Author notes

  1. A. Ya. Gorenberg

    Present address: Institute of Chemical Physics of the Russian Academy of Sciences, ul. Kosygina 4, 117977, Moscow, Russian Federation

Authors and Affiliations

  1. Freiburg Materials Research Center FMF, Hermann-Staudinger-Haus, Albert Ludwigs University, Stefan-Meier-Strasse 31, W-7800, Freiburg, Federal Republic of Germany

    S. N. Magonov, A. Ya. Gorenberg & H.-J. Cantow

  2. Institut für Makromolekulare Chemie, Hermann-Staudinger-Haus, Albert Ludwigs University, Stefan-Meier-Strasse 31, W-7800, Freiburg, Federal Republic of Germany

    S. N. Magonov, A. Ya. Gorenberg & H.-J. Cantow

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  1. S. N. Magonov
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  2. A. Ya. Gorenberg
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  3. H.-J. Cantow
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Magonov, S.N., Gorenberg, A.Y. & Cantow, HJ. Atomic force microscopy on polymers and polymer related compounds. Polymer Bulletin 28, 577–584 (1992). https://doi.org/10.1007/BF00296049

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  • DOI: https://doi.org/10.1007/BF00296049

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