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X-ray photoelectron spectroscopic studies with a bias-potential method for studying silane-aluminium interfaces

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Journal of Materials Science Letters

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Authors and Affiliations

  1. Department of Chemistry, University of British Columbia, 2036 Main Mall, V6T 1Z1, Vancouver, British Columbia, Canada

    Y. L. Leung, Y. P. Yang, P. C. Wong & K. A. R. Mitchell

  2. Chemistry Group, Defence Research Establishment Pacific, V0S 1B0, FMO Victoria, British Columbia, Canada

    T. Foster

Authors
  1. Y. L. Leung
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  2. Y. P. Yang
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  3. P. C. Wong
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  4. K. A. R. Mitchell
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  5. T. Foster
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Leung, Y.L., Yang, Y.P., Wong, P.C. et al. X-ray photoelectron spectroscopic studies with a bias-potential method for studying silane-aluminium interfaces. J Mater Sci Lett 12, 844–846 (1993). https://doi.org/10.1007/BF00277993

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  • DOI: https://doi.org/10.1007/BF00277993

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