References
N. W. Loney and C. R. Huang, Thin Solid Films 226 (1993) 15.
J. C. Hong and H. H. Lee, J. Crystal Growth g71 (1985) 711.
S. Middleman and A. Yeckel, J Electrochem. Soc. 133 (1986) 1951.
J. P. Charlier, IEEE Trans. Electron Devices Ed28 (1981) 501.
R. B. Bird, W. E. Stewart and E. N. Lightfoot, in “Transport phenomena”, (John Wiley & Sons, 1960) p. 51.
G. K. Smith, B. B. Krieger and P. M. Herzog, AIChE J. 26 (1980) 567.
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Loney, N.W. Justification of the assumption of transport. by diffusion in the interwafer region of a multiwafer CVD reactor. J Mater Sci Lett 15, 1219–1220 (1996). https://doi.org/10.1007/BF00274380
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DOI: https://doi.org/10.1007/BF00274380