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Thickness dependence of crystalline orientation in YBa2Cu3Ox thin films grown by metalorganic chemical vapour deposition

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Journal of Materials Science Letters

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Authors and Affiliations

  1. Korea Institute of Science and Technology, PO Box 131, 130-650, Seoul, Korea

    W. N. Kang, Y. H. Kim, C. H. Kim, J. W. Jang, I. T. Kim, S. S. Choi & T. S. Hahn

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  1. W. N. Kang
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  2. Y. H. Kim
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  3. C. H. Kim
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  4. J. W. Jang
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Kang, W.N., Kim, Y.H., Kim, C.H. et al. Thickness dependence of crystalline orientation in YBa2Cu3Ox thin films grown by metalorganic chemical vapour deposition. J Mater Sci Lett 15, 1898–1901 (1996). https://doi.org/10.1007/BF00264090

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  • DOI: https://doi.org/10.1007/BF00264090

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