References
G. J.Clark, A. D.Marwick, R. H.Koch and R. B.Laibowitz, Appl. Phys. Lett. 57 (1987) 139.
G. P.Summers, E. A.Burke, D. B.Chrisey, M.Nastasi and J. R.Tesmer, Appl. Phys. Lett. 55 (1989) 1469.
A. E.White, K. T.Short, J. P.Garno, R. C.Dynes, L. F.Schneemeyer, J.Waszczak, A. F. J.Levi, M.Anzlowar and K. wWBaldwin, Nucl. Instr and Meth. B37/38 (1989) 923.
Y.Li, G. C.Xiong and Z. Z.Gan, Physica C 199 (1992) 269.
A. D.Marwick and G. J.Clark, Nucl. Instr Meth. B37/38 (1989) 910.
S. J.Pennycook, R.Feenstra, M. F.Chrisholm and D. P.Norton, Nucl. Instr Meth. B79 (1993) 641.
Y. H.Li, C.Leach, T. J.Tate, M. J.Lee, YupuLi, J. A.Kilner and P. G.Quincey, J. Mater. Sci. 30 (1995) 5927.
X. D.Wu, L.Luo, R. E.Muenchausen and S. R.Foltyn, J. Mater. Res. 7 (1992) 531.
J. Ziegler, J. P. Biersack and U. Littmark, TRIM 92, IBM Research, NY, USA.
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Li, Y.H., Staton-Bevan, A.E., Tate, T.J. et al. Effects of Ne+ implantation and rapid thermal annealing on the microstructure and electrical properties of YBCO thin films. J Mater Sci Lett 15, 1836–1838 (1996). https://doi.org/10.1007/BF00264070
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DOI: https://doi.org/10.1007/BF00264070