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Effects of Ne+ implantation and rapid thermal annealing on the microstructure and electrical properties of YBCO thin films

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Journal of Materials Science Letters

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Li, Y.H., Staton-Bevan, A.E., Tate, T.J. et al. Effects of Ne+ implantation and rapid thermal annealing on the microstructure and electrical properties of YBCO thin films. J Mater Sci Lett 15, 1836–1838 (1996). https://doi.org/10.1007/BF00264070

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  • DOI: https://doi.org/10.1007/BF00264070

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