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Transmission electron microscopy characterization of a ceria-fluxed silicon nitride

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Journal of Materials Science Letters

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Authors and Affiliations

  1. Max-Planck-Institut für Metallforschung, Institut für Werkstoffwissenschaft, Seestraße 92, D-7000, Stuttgart 1, FRG

    H. -J. Kleebe & M. K. Cinibulk

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  1. H. -J. Kleebe
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  2. M. K. Cinibulk
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Kleebe, H.J., Cinibulk, M.K. Transmission electron microscopy characterization of a ceria-fluxed silicon nitride. J Mater Sci Lett 12, 70–72 (1993). https://doi.org/10.1007/BF00241851

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  • DOI: https://doi.org/10.1007/BF00241851

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