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Quantitative characterization of fracture surface roughness using secondary electron line scanning method

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Journal of Materials Science Letters

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Li, X., Tian, J., Kang, Y. et al. Quantitative characterization of fracture surface roughness using secondary electron line scanning method. J Mater Sci Lett 15, 2137–2140 (1996). https://doi.org/10.1007/BF00241150

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  • DOI: https://doi.org/10.1007/BF00241150

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