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A scanning conduction microscopic method for probing abrasion of insulating thin films

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Abstract

The use of scanning force microscopy (SFM) to probe wear processes at interfaces is of considerable interest. We present here a simple modification of the SFM which allows us to make highly spatially resolved measurements of conductivity changes produced by abrasion of thin insulating films on metal substrates. The technique is demonstrated on fluorocarbon polymer thin films deposited on stainless steel substrates.

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Authors and Affiliations

  1. Department of Physics, Washington State University, 99164-2814, Pullman, WA, USA

    J. T. Dickinson & K. H. Siek

  2. Department of Chemistry, Washington State University, 99164-2814, Pullman, WA, USA

    K. W. Hipps

Authors
  1. J. T. Dickinson
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  2. K. H. Siek
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  3. K. W. Hipps
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Dickinson, J.T., Siek, K.H. & Hipps, K.W. A scanning conduction microscopic method for probing abrasion of insulating thin films. Tribol Lett 1, 159–175 (1995). https://doi.org/10.1007/BF00209771

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